Lequime, M., Institut Fresnel, Aix Marseille Université - Ecole Centrale Marseille - CNRS, UMR7249, 13397 Marseille, France
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Vol 8 (2013) - Regular papers
Refractive index determination of SiO2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs
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