Lemarchand, F., Institut Fresnel, Aix Marseille Université - Ecole Centrale Marseille - CNRS, UMR7249, 13397 Marseille, France, France

• Vol 8 (2013) - Regular papers
  Refractive index determination of SiO2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs
  Abstract  PDF