Taalat, R., Institut d’Electronique du Sud, UMR-CNRS 5214, Universite Montpellier 2, Place Eugne Bataillon, 34095 Montpellier Cedex 5, France
Taghizadeh, M. R.
Taheri, N.
Takahashi, S.
Takamasu, K.
Takamasu, K., The University of Tokyo, Department of Precision Engineering, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656, Japan (Japan)
Takamasu, K., Department of Precision Engineering, The University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656, Japan
Talib, J. M., Photonics Research Centre (Department of Physics), University of Malaya, 50603 Kuala Lumpur, Malaysia
Tamchek, N.
Tan, C. S., Faculty of Engineering, Multimedia University, Cyberjaya 63100 Selangor, Malaysia
Tan, C. S., Faculty of Engineering, Multimedia University, Jalan Multimedia, 63000 Cyberjaya, Selangor, Malaysia
Tan, Q.
Tan, Q.
Tan, Q., Department of Precision Instruments, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China (China)
Tan, Q.-F., State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, People’s Republic of China
Tanabe, T., Institute of Multidisciplinary Research for Advanced Materials, Tohoku University 2-1-1, Katahira, Aoba-ku, Sendai, 980-8577, Japan
Tanaka, A., Nikon and Essilor International Joint Research Center Co., Ltd., Kawasaki, 213-0012, JAPAN
Tang, C., Chengdu Fine Optical Engineering Research Center, Chengdu, 610041, China
Tang, J., College of Science, University of Shanghai for Science and Technology, Shanghai 200093, China
Tang, Z., Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, College of Information Science and Engineering, Hunan University, Changsha 410082, People’s Republic of China
Tankam, P.
Taoda, T., Faculty of Engineering, Ehime University, 3 Bunkyo, Matsuyama 790-8577, Japan
Taouri, A.
Tariaki, M.
Tasche, D., University of Applied Sciences and Arts, Laboratory of Laser and Plasma Technologies, Von-Ossietzky-Straße 99, 37085 Göttingen, Germany
Tascu, S.
Tasolamprou, A. C.
Tassev, V.
Tatoli, T., Optoelectronics Laboratory, Politecnico di Bari, Via Orabona 4, 70125 Bari, Italy
Török, P.
Török, Peter
Termkoa, K.
Terracciano, M., Institute for Microelectronics and Microsystems, National Council of Research, Via P. Castellino 111, I-80131 Naples, Italy
Tervo, J.
Tetu, A.
Thambiratnam, K.
Tharwat, M. M., Department of Electrical Engineering, Faculty of Engineering, King Abdulaziz University, Jeddah 21432, Saudi Arabia
Thayil, A.
Thøgersen, J.
Thienpont, H.
Thienpont, H. (Belgium)
Thomae, D., University of Applied Sciences “Ernst-Abbe-Fachhochschule Jena”, Carl-Zeiss-Promenade 2, 07745 Jena, Germany
Thomas, W., Electrical and Computer Engineering Department, Michigan Technological University, Houghton, MI 49931, United States of America
Thompson, J. E.
Thorstensen, J., SINTEF ICT, Optical measurement systems, 0373 Oslo, Norway
Thundat, T.
Tian, H.
Ticos, C. M.
Tien, C.-L., Department of Electrical Engineering, Feng Chia University, Taichung 40724, Taiwan
Tillack, B.

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