A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

D

Ducci, S.
Dudelzak, A. E.
Dudley, J. M., Département d’Optique P.M. Duffieux, Institut FEMTO-ST, UMR 6174 CNRS Université de Franche-Comté, 25030 Besancon Cedex, France
Duhem, F., Thales Research & Technology France, 1 Avenue Augustin Fresnel, 91767 Palaiseau Cedex, France
Duling III, I. N.
Dunn, C., University College London, Dpt Physics and Astronomy, London, WC1E 6BT, UK
Dunn, J. F.
Duval, F.

E

Ebata, K., Industrial Materials and Process Technology R&D Laboratories, Sumitomo Electric Industries, Ltd.1-1-1, Koyakita, Itami-shi, Hyogo 664-0016, Japan
Ebbinghaus, P., Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Edelmann, A., Chair of Micro- and Nanophotonics, FernUniversit¨at in Hagen, Germany
Ehret, G.
Ehssani, H.
Ejsing, S.
El Gawhary, O.
El Gawhary, O., Optics Research Group, Department of Imaging Science and Technology, Faculty of Applied Sciences, Delft University of Technology, P. O. Box 5046, 2600GA Delft, The Netherlands (Netherlands)
El-Sheikh, H. M., Moscow State University of Geodesy and Cartography (MIIGAiK), Moscow
Elbaz, D.
Eltaif, T., Faculty of Engineering & Technology, Multimedia University, Melaka, Malaysia
Emplit, P.
Englander, A.
Enoch, S.
Ensell, G.
Eppig, T., Experimental Ophthalmology, Saarland University, Kirrberger Strasse 100, 66424 Homburg, Germany
Erbe, A., Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Erfanian, A.
Escalante, N., Unidad Academica de Ingenieria Electrica, Universidad Autonoma de Zacatecas, Antiguo Camino a la Bufa No. 1, Col. Centro. C. P. 98000, Zacatecas, Zac., Mexico
Evangelisti, F.
Evans, R.
Ezdi, K.

F

Fabre, M.
Fabritius, Tapio
Fadhil, H. A., School of Computer and Communication Engineering, University Malaysia Perlis (UniMAP), Perlis, Malaysia
Fahlbusch, T.
Faklaris, O.
Falldorf, C.
Fan, D.
Fan, D., Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, College of Information Science and Engineering, Hunan University, Changsha 410082, People’s Republic of China (China)
Fan, Z.-W., Department of Optoelectronic Engineering, Academy of Opto-Electronics, Chinese Academy of Sciences, No. 9 Dengzhuang south Road, Haidian District, Beijing 100094, People’s Republic of China
Fang, L., Key Laboratory of Nondestructive Test (Ministry of Education), Nanchang Hangkong University, Nanchang, 330063, China
Farahi, R. H.
Faraji, N.
Farsund, O.
Favero, I.
Favilla, E.
Fazea, Yousef, Universiti Utara Malaysia
Fazio, E.
Félix, S., LAUM CNRS Université du Maine, avenue Olivier Messiaen 72085 Le Mans France
Fechner, R.
Fedorov, V. A., RPC Optolink Ltd, 124489, Zelenograd, Russia

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