Polarimetric approach for man-made impurities detection in isotropic materials

A. Buono; M. Iodice; I. Rendina; F. Nunziata; M. Migliaccio

doi:10.2971/jeos.2014.14010

Journal of the European Optical Society - Rapid publications, Vol 9 (2014)

Polarimetric approach for man-made impurities detection in isotropic materials

A. Buono, M. Iodice, I. Rendina, F. Nunziata, M. Migliaccio

Abstract

In this paper, a new kind of approach to reveal the presence of well-defined impurities in isotropic materials is proposed and verified against actual measurements over real samples. The rationale lies in the different polarimetric symmetry properties of inhomogeneous and isotropic materials within well-defined impurities from homogeneous ones. The underpinning physical idea is to inspect the Mueller matrix of the material sample, obtained from an ellipsometric measure: its form, in terms of symmetry, can reveal whether or not if in there are well-defined impurities in the sample.

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References

H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications (Wiley, Tokyo, 2007).

M. Born, and E. Wolf, Principles of Optics (Pergamon Press, Bath, 1970).

G. E. Jellison Jr., ”Spectroscopic ellipsometry data analysis - Measured versus calculated quantities,” Thin Solid Films 313, 33–39 (1998).

G. E. Jellison Jr., ”Data analysis for spectroscopic ellipsometry,” Thin Solid Films 234(1-2), 416–422 (1993).

G. E. Jellison Jr., V. I. Merkulov, A. A. Puretzky, D. B. Geohegan, G. Eres, D. H. Lowndes, and J. B. Caughman, ”Characterization of thin film amorphous semicondutcors using spectroscopic ellipsometry,” Thin Solid Film 377, 68–73 (2000).

G. E. Jellison Jr., L. A. Boatner, D. H. Lowndes, R. A. McKee, and M. Godbole, ”Optical functions and transparent thin films of SRTIO3, BATIO3, and SIOX determined by spectroscopic ellipsometry,” Appl. Optics 33, 6053–6058 (1994).

O. Pena-Rodriguez, C. F. Sanchez-Valdes, M. Garriga, M. I. Alonso, X. Obradors, and T. Puig, ”Optical properties of ceria-zirconia epitaxial films grown on chemical solutions),” Mater. Chem. Phys 138, 462–467 (2013).

M. Stchakovsky, C. Caillaud, M. Foldyna, R. Ossikovski, and E. Garcia-Caurel, ”Polarimetric characterization of optically anisotropic flexible substrates,” Thin Solid Films 516, 1414–1418 (2008).

R. M. A. Azzam, ”Ellipsometry,” in Handbook of Optics, M. Bass, eds., Ch. 16 (Third edition, McGraw-Hills, New York, 2009).

R. M. A. Azzam, ”Mueller matrix ellipsometry: a review,” P. Soc. Photo-Opt. Ins. 396 400–409 (1997).

G. E. Jellison Jr., Ellipsometry data analysis: a tutorial (Oak Ridge National Laboratory, University of Michigan, 2000).

D. Schmidt, Generalized ellipsometry on sculptured thin films made by glancing angle deposition (Ph.D. dissertation, University of Nebraska, 2010).

C. E. Baum, and H. N. Kritikos (eds.), Electromagnetic Symmetry (Taylor and Francis, New York, 1995)

S. V. Nghiem, S. H. Yueh, R. Kwok, and F. K. Li, ”Symmetry properties in polarimetric remote sensing,” Radio Sci. 27, 693–711 (1992).

W. C. Chew, ”A new look at reciprocity and energy conservation theorems in electromagnetics,” IEEE T. Antenn. Propag. 56, 970–975 (2009).

F. Nunziata, M. Migliaccio, and C. E. Brown, ”Reflection symmetry for polarimetric observation of man-made metallic targets at sea,” IEEE J. Oceanic Eng. 37, 384–394 (2012).

S. H. Yueh, R. Kwok, and S. V. Nghiem, ”Polarimetric scattering and emission properties of targets with reflection symmetry,” Radio Sci. 29, 1409–1420 (1994).

J. J. Gil, ”Polarimetric characterization of light and media,” Eur. Phys. J-Appl. Phys. 40, 1–47 (2007).

A. Guissard, Introduction to radar polarimetry (Technical report of the Laboratoire de Télécommunications et Télédetection of the Faculté des Sciences Appliquées Université catholique de Louvain, 2000).

S. R. Cloude, Polarisation: Applications in Remote Sensing (Oxford Press, New York, 2009).

J. J. van Zyl, C. H. Papas, and C. Elachi, "On the optimum polarization of incoherently reflected waves,” IEEE T. Antenn. Propag 35, 818–826 (1987).

J. J. Gil, and E. Bernabeu, ”A depolarization criterion in Mueller matrices,” Opt. Acta 32, 259–261 (1985).

A. Schonhofer, and H. G. Kuball, ”Symmetry properties of the Mueller matrix,” Chem. Phys. 115, 159–167 (1987).

C. E. Baum, ”Symmetry in electromagnetic scattering as a target discriminant,” P. Soc. Photo-Opt. Ins. 3120, 295 (1997).

C. E. Baum, ”Symmetry in target recognition,” in Proceedings to the Fourth International Conference on Ultrawideband Ultrashort Impulse Signals, 12–15 (Sevastopol, Ukraine, 2008).

D. M. Rosu, Ellipsometric characterization of anisotropic thin organic films (Ph.D. dissertation, Technischen Universitat Berlin, 2010).

A. C. Galca, Ellipsometric studies of anisotropic nanoscaled media (Ph.D. dissertation, University of Twente, 1977).

J. Yvon, Spectroscopic Ellipsometry User Guide (HORIBA, Irvine, 2008).