Journal of the European Optical Society - Rapid publications, Vol 6 (2011)

HVPE growth and characterization of GaP on different substrates and patterned templates for frequency conversion devices

V. Tassev, D. Bliss, M. Snure, G. Bryant, R. Peterson, R. Bedford, C. Yapp, W. Goodhue, K. Termkoa

Abstract


This article describes efforts to achieve fast deposition of thick Quasi-Phase-Matched (QPM) GaP structures with high surface and structural quality on oriented patterned (OP) templates in a Hydride Vapor Phase Epitaxial (HVPE) process. These QPM structures will be incorporated in devices for conversion of frequencies from the near infrared to the mid infrared and THz regions, where powerful and tunable sources are in great demand for both military and civilian applications. In contrast with GaAs—the most studied OP QPM material—the two-photon absorption of GaP is predicted to be extremely low, which allows pumping with a number of convenient sources between 1 – 1.7 µm. Unpatterned GaP layers up to 370 µm thick were grown with growth rates up to 93 µm/hr with high reproducibility on bare substrates. The layers demonstrated smooth surface morphology with RMS < 1 nm and high structural quality with FWHM equal to 39 arcsec for layers grown on GaP and 112 arcsec for those grown on GaAs. Growth on OP-GaP templates resulted in 142 µm thick QPM structures deposited at a growth rate of 71 µm/h with good vertical (normal to the layer surface) propagation of the initial pattern. When the growth was performed on OP-GaAs one of the domains showed a trend toward a faceting growth. Further investigations are in progress to equalize the vertical and lateral growth of the two domains, and determine the best orientation of the substrate and pattern in order to achieve structures thick enough for high power nonlinear applications.

© The Authors. All rights reserved. [DOI: 10.2971/jeos.2011.11017]

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References


A. Godard, "Infrared (2-12 _m) solid-state laser sources: a re- view" CR Phys. 8, 1100-1128 (2007).

A. Zajac, M. Skorczakowski, J. Swiderski, and P. Nyga, "Electrooptically Q-switched mid-infrared Er: YAG laser for medi- cal applications" Opt. Express 12, 5125-5130 (2004).

J. G. Kim, L. Shterengas, R. U. Martinelli, and G. L. Belenky, "High -power room-temperature continuous wave operation of 2.7 and 2.8 _m In(Al)GaAsSb/GaSb diode lasers" Appl. Phys. Lett. 83, 1926-1928 (2003).

R. Kaspi, A. P. Ongstad, G. C. Dente, J. R. Chavez, M. L. Tilton, and D. Gianardi, "High power and high brightness from an opti- cally pumped InAs/InGaSb type-II midinfrared laser with low confinement" Appl. Phys. Lett. 81, 406-408 (2002).

S. B. Blickenstaff, A. M. Sarangan, T. R. Nelson Jr., K. D. Leedy, and D. L. Agresta, "Influence of shadow mask design and depo- sition methods on non-planar dielectric material deposition" J. Microlithogr., Microfab. and Microsyst. 4, 0230151-0230156 (2005).

L. E. Myers, W. R. Bosenberg, "Periodically poled lithium niobate and quasi-phase-matched optical parametric oscillators", J. Quant. Elect. 33, 1663-1672 (1997).

A. Szilagyi, A. Hordvik, and H. Schlossberg, "A quasi-phase- matching technique for efficient optical mixing and frequency doubling" J. Appl. Phys. 47, 2025-2032 (1976).

L. A. Eyres, P. J. Tourreau, T. J. Pinguet, C.B. Ebert, J.S. Harris, M.M. Fejer, L. Becouarn, B. Gerard, and E. Lallier, "All-epitaxial fabrication of thick, orientation-patterned GaAs films for nonline- ar optical frequency conversion" Appl. Phys. Lett. 79, 904-906 (2001).

C. Lynch, D. Bliss, T. Zens, V. Tassev, P. Kuo, A. Lin, J. Harris, M. Fejer, and P. Schunemann, Mm-thick orientation-patterned GaAs for IR and THz generation (ICVGE-13, Salt Lake City, 12-17 August 2007).

C. Kieleck, M. Eichhorn, A. Hirth, D. Faye, and E. Lallier, "High- efficiency 20-50 kHz Mid-infrared orientation-patterned GaAs optical parametric oscillator pumped by a 2_m holmium laser" Opt. Lett. 34, 262-264 (2009).

W. Hurlbut, Y. Lee, K. Vodopyanov, P. Kuo, and M. Fejer, "Multi- photon absorption and nonlinear refraction of GaAs in the mid- infrared" Opt. Lett. 32, 668-670 (2007).

L. H. Bechtel and W. L. Smith, "Two-photon absorption in semi- conductors with picoseconds laser pulses" Phys. Rev. B 13, 3515 -3522 (1976).

I. Shoji, T. Kondo, A. Kitamoto, M. Shirane, and R. Ito, "Absolute scale of second-order nonlinear-optical coefficients" J. Opt. Soc. Am. B 14, 2268-2294 (1997).

M. E. Thomas, D. W. Blodgett, D. V. Hahn, and S. G. Kaplan, "Characterization and modeling of the infrared properties of GaP and GaAs" Proc. SPIE 5078,159-168 (2003).

I. Shoji, and T. Taira, "Transmittance spectra of GaAs and GaP in far-infrared region" Ultraviolet Synchrotron Orbital Radiation Activity Report 2001,142-143 (2002).

A. N. Pikhtin, and D. A. Yaskov, "Infrared absorption in gallium phosphide" Phys. Status Solidi (b) 34, 815-824 (1969).

I. Tomita, "Fabrication and characterization of a quasi-phase- matched GaP optical device for terahertz-wave generation" Opt. Mater. 32, 323-328 (2009).

T. Matsushita, I. Ohta, and T. Kondo, "Quasi-phase-matched parametric fluorescence in a periodically inverted GaP wave- guide" Appl. Phys. Exp. 2, 0611011-0611013 (2009).

T. Matsushita, T. Yamamoto, and T. Kondo, "Epitaxial growth on spatially inverted GaP for quasi-phase-matched nonlinear optical devices" Jap. J. Appl. Phys. 17, L408-410 (2007).

J. W. Lee, J. Salzman, D. Emerson, J. Shealy, and J. M. Ballantyne, "Selective area growth of GaP on Si by MOCVD" J. Cryst. Gr. 172, 53-57 (1997).

C. Lynch, V. Tassev, D. Bliss, and G. Bryant, Growth on orienta- tion patterned semiconductors for nonlinear optical frequency conversion (Advances in Optical Materials, San Jose, 11 Oct. 2009).

V. Tassev, D. Bliss, C. Lynch, C. Yapp, W. Goodhue, and K. Term- koa, "Low pressure-temperature-gas flow HVPE growth of GaP for nonlinear optical frequency conversion devices" J. Cryst. Growth 312, 1146-1149 (2010).

C. C. Wang, and S. H. McFarlane, "Epitaxial growth and charac- terization of GaP on insulating substrates" J. Cryst. Growth 13/14, 262-267 (1972).

W. G. Oldham, "Vapor growth of GaP on GaAs substrates" J. Appl. Phys. 36, 2887-2890 (1965).

W. G. Spitzer, M. Gershenzon, C. J. Frosch, and D. F. Gibbs, "Optical absorption in n-type gallium phosphide" J. Phys. Chem. Sol. 11 3/4, 339-341 (1959).

D. A. Yasakov, A. N. Pikhtin, and V. I. Ulyanov, "Optical proper- ties of gallium phosphide grown by floating zone" Mat. Res. Bull. 4, 839-848 (1969).

N. J. Kadhim, and D. Mikherjee, "Growth defects associated with MBE deposited GaAs layers" Vacuum 55, 249-253 (1999).

M. Weyers, and M. Sato, "Growth of GaP by MOVPE at very low pressure: kinetics and carbon incorporation" J. Cryst. Growth 115, 469-473 (1991).

D. W. Shaw, "Kinetic aspects in the vapor phase epitaxy of III-V compounds" J. Cryst. Growth 31, 130-141 (1975).

R. Karlicek, D. Mitcham, J. Ginocchio, and B. Hammarlund, "The effect of formation on the morphology and growth rate of InP grown by hydride vapor phase epitaxy" J. Electrochem. Soc. 134, 470-474 (1987).

E. Lafon, J. Napierala, D. Castellici, A. Pimpinelli, R. Cadoret, and B. Gerald, "Selective growth of GaAs by HVPE: keys for accurate control of the growth morphologies" J. Cryst. Growth 222, 482-496 (2001).

J. W. Allen, and J. W. Hodby, "Infrared absorption in GaP-GaAs Allows: Absorption in n-type materials" Proc. Phys. Soc. 82, 315- 323 (1963).

J. W. Hodby, "Infrared absorption in GaP-GaAs Alloys: Absorption in p-type materials" Proc. Phys. Soc. 82, 324-326 (1963).

D. T. J. Hurle, "Charged native points defects in GaAs and other III-V compounds" J. Cryst. Growth 237, 1621-1627 (2002).

K. Gruter, M. Deschler, H. Jurgensen, R. Beccard, and P. Balk, "Deposition of high quality GaAs films at fast rates in the LP-CVD system" J. Cryst. Growth 94, 607-612 (1989).

E. Putz, E. Veuhoff, K. H. Bachem, P. Balk, and H. Luth, "Low pressure vapor phase epitaxy of GaAs in a halogen transport system" J. Electrochem. Soc. 128, 2202-2206 (1981).

C. Kieleck, M. Eichhorn, A. Hirth, D. Faye, and E. Lallier, "20-50 kHz "Mid-Infrared OP-GaAs OPO", Proc. CLEO/QELS (2008).

J. Li, D. Fenner, K. Termkoa, M. Allen, P. Moulton, C. Lynch, D. Bliss, and W. Goodhue, "Wafer-fused orientation pattern GaAs" Proc. SPIE 6875, 68750H (2008).

K. Termkoa , V. Mathur , X. Qian , W. Goodhue , D. Bliss, R. Peter- son, and V. Tassev, Development of a Wafer Fusion Process for Producing Patterned GaP Templates (APS March Meeting, Pitts- burgh, 16-20 March 2009).

K. Termkoa, S. Vangala, W. Goodhue, R. Peterson, R. Bedford, V. Tassev, C. Lynch, and D. Bliss, "Orientation-patterned GaP using wafer fusion technique" Opt. Mater. (submitted).

R. Karlisek, B. Segner, J. Wynn, A. Becker, U. Chakrabarti, and R. Logan, "Regrowth of semi-insulating InP around etched mesas using hydride vapor phase epitaxy" J. Electrochem. Soc. 137, 2639-2642 (1990).